发明名称 Multi-beam shaped beam lithography system
摘要 A multi-beam shaped-beam electron beam lithography system employs conventional lenses and magnetic deflectors, with an array of lithographically fabricated electrodes disposed about a central axis to simultaneously and independently deflect electron beams in beamlet exposure ranges separated transversely from one another within a subfield, so that subfields overlap.
申请公布号 US6614035(B2) 申请公布日期 2003.09.02
申请号 US20020059786 申请日期 2002.01.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HARTLEY JOHN G.
分类号 G21K1/08;H01J37/317;(IPC1-7):G03F9/00 主分类号 G21K1/08
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