| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce a through current to flow in a test mode as much as possible. <P>SOLUTION: An input interface circuit 10 is provided with a P-type MOS transistor P15 connected to the gate terminals of P-type MOS transistors P11 and P12 in a differential comparator circuit DCC. By turning on the MOS transistor P15 in the test mode, the MOS transistors P11 and P12 can be turned off and the through current to flow via the MOS transistors P11 and P12 is cut. Besides, a MOS transistor P14 to function as a resistor in the test mode is connected to a MOS transistor N11. By controlling on/off of the MOS transistor P14, an output signal Q12 of the input interface circuit 10 can be switched to a high level or to a low level. <P>COPYRIGHT: (C)2003,JPO |
