发明名称 |
BUMP FORMING METHOD, BUMP ATTACHED SEMICONDUCTOR ELEMENT AND MANUFACTURING METHOD THEREOF, SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF, SUBSTRATE AND ELECTRONIC DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To simply form a bump easy to be connected by means of wire bonding. <P>SOLUTION: A bump forming method includes processes as follows; (a) a point 22 formed in a ball-shape in a wire 20 is bonded to an electrode 12 by using a tool 30, (b) a part 24 of the wire 20 is drawn from the point 22 that has been bonded, (c) a portion continued from the point 22 of the wire 20 is squashed on the point 22 to form a bump 40 on the electrode 12, (d) the wire 20 is cut with the bump 40 allowed to remain on the electrode 12. <P>COPYRIGHT: (C)2003,JPO |
申请公布号 |
JP2003243436(A) |
申请公布日期 |
2003.08.29 |
申请号 |
JP20020041678 |
申请日期 |
2002.02.19 |
申请人 |
SEIKO EPSON CORP |
发明人 |
TAKAHASHI TAKUYA |
分类号 |
H01L21/60;H01L21/607;H01L23/485;H01L23/495 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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