发明名称 LITHOGRAPHY APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a lithography apparatus and a device manufacturing method, where gray scaling is performed with a relatively high throughput, and a device is manufactured at a relatively high yield. SOLUTION: Two or more patterned projection beams having different patterns and intensities are simultaneously projected on a substrate. The gray scaling is realized by making component projection beams PB1-PB4 pass variable attenuaters VA1-VA4, respectively, to generate individual intensities I1-I4 which are arbitrarily selected. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003243300(A) 申请公布日期 2003.08.29
申请号 JP20020382826 申请日期 2002.11.29
申请人 ASML NETHERLANDS BV 发明人 VAN DER MAST KAREL DIEDERICK
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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