发明名称 THIN-FILM SEMICONDUCTOR DEVICE, ELECTROOPTIC DEVICE, ELECTRONIC EQUIPMENT, METHOD FOR MANUFACTURING THIN- FILM SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING ELECTROOPTIC DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a thin-film semiconductor device, electrooptic device, electronic equipment, method for manufacturing thin-film semiconductor devices, and a method for manufacturing electrooptic devices, capable of reducing the occurrence of erroneous operations by improving the on-current balance between an N-channel type TFT and a P-channel type TFT used in a complementary circuit. <P>SOLUTION: In a TFT array substrate 10, a picture element switching TFT 30 assumes both a bottom gate structure and a top gate structure. A low- concentration source region 1b and a low-concentration drain region 1c are positioned facing the end of a scanning line 3a through a second gate insulating film 2b in between them and, moreover, facing the edges of a first gate electrode 8a, this with a first gate insulating film 2a in between them. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003243659(A) 申请公布日期 2003.08.29
申请号 JP20020034711 申请日期 2002.02.12
申请人 SEIKO EPSON CORP 发明人 TAKENAKA SATOSHI
分类号 G02F1/1368;G09F9/30;G09F9/35;H01L21/336;H01L29/786;(IPC1-7):H01L29/786;G02F1/136 主分类号 G02F1/1368
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