发明名称 REFLECTING MASK, ALIGNER, AND CLEANING METHOD THEREFOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a reflecting mask capable of preventing transfer failure caused by sticking of dirts. <P>SOLUTION: The reflecting mask comprises a substrate 1, an X-ray reflecting multilayer film 2 formed on the substrate 1, and an absorber layer 3 of a material of low X-ray transmissivity which is formed on it and has a prescribed pattern. A protection layer 4 of photocatalyst material is formed between the X-ray reflecting multilayer film 2 and the absorber layer 3. Thanks to the reflecting mask, contaminants on the mask surface are removed by optical radiation, etc., in an oxygen-contained atmosphere. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003243292(A) 申请公布日期 2003.08.29
申请号 JP20020039990 申请日期 2002.02.18
申请人 NIKON CORP 发明人 ISHIYAMA WAKANA
分类号 G03F1/22;G03F1/24;G03F7/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/22
代理机构 代理人
主权项
地址