发明名称 SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To prevent the occurrence of breakdown by preventing large charge from flowing through a parasitic PN junction diode of an output transistor when negative static charge is applied to an output terminal, without employing a method in which an off transistor is put in the output terminal as an ESD protective element. SOLUTION: Related to an semiconductor element whose output terminal is connected to an N-type MOS transistor, a Schottky barrier diode is connected in parallel with the N-type MOS transistor connected to the output terminal. Thereby, even when the negative static charge is applied to the output terminal, the large charge is released through the Schottky barrier diode, so that ESD breakdown does not occur. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003243523(A) 申请公布日期 2003.08.29
申请号 JP20020045032 申请日期 2002.02.21
申请人 SEIKO INSTRUMENTS INC 发明人 OMI TOSHIHIKO;SHIMIZU TORU
分类号 H01L27/04;H01L21/822;H01L21/8238;H01L27/06;H01L27/092;(IPC1-7):H01L21/822;H01L21/823 主分类号 H01L27/04
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