发明名称 High/low work function metal alloys for integrated circuit electrodes and methods of fabricating same
摘要 Integrated circuit electrodes include an alloy of a first metal and a second metal having lower work function than the first metal. The second metal also may have higher oxygen affinity than the first metal. The first metal may be Ru, Ir, Os, Re and alloys thereof, and the second metal may be Ta, Nb, Al, Hf, Zr, La and alloys thereof. Both NMOS and the PMOS devices can include gate electrodes of an alloy of the first metal and the second metal having lower work function than the first metal. The PMOS gate electrode may have a higher percentage of the first metal relative to the second metal than the NMOS gate electrode. Thus, a common material system may be used for gate electrodes for both NMOS and PMOS devices.
申请公布号 US2003160227(A1) 申请公布日期 2003.08.28
申请号 US20020081861 申请日期 2002.02.22
申请人 MISRA VEENA;ZHONG HUICAI;HONG SHINNAM 发明人 MISRA VEENA;ZHONG HUICAI;HONG SHINNAM
分类号 H01L21/28;H01L21/8238;H01L29/49;(IPC1-7):H01L47/00 主分类号 H01L21/28
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