DEVICE FOR THE EXAMINATION OF SAMPLES BY MEANS OF X-RAYS

摘要

A device (1) for the examination of samples by means of X-rays or the like, the device being provided with at least one X-ray source which can be mounted in an exchangeable constructional unit (5) and with an analysis chamber (4) which encloses an exit window (6) of the X-ray source in its operative position and whereto the constructional unit (5) with the X-ray source can be attached. The device is constructed in such a manner that respective, matching parts (9; 10) of a safety system (7) are associated with the analysis chamber (4) and the constructional unit (5) with the X-ray source.