发明名称 METHOD AND APPARATUS FOR FAULT TOLERANT AND FLEXIBLE TEST SIGNATURE GENERATOR
摘要 An apparatus with a generator to generate a pattern and multiple scan chains (110) configured to receive the pattern from the generator. Multiple signature registers (116, 118) coupled to the scan chains, to receive an output of at least one of scan chains during a mode of the integrated device.
申请公布号 WO02095587(A3) 申请公布日期 2003.08.28
申请号 WO2002US15806 申请日期 2002.05.16
申请人 INTEL CORPORATION;UDAWATTA, KAPILA, B.;BABELLA, ANTHONY 发明人 UDAWATTA, KAPILA, B.;BABELLA, ANTHONY
分类号 G01R31/3185 主分类号 G01R31/3185
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