METHOD AND APPARATUS FOR FAULT TOLERANT AND FLEXIBLE TEST SIGNATURE GENERATOR
摘要
An apparatus with a generator to generate a pattern and multiple scan chains (110) configured to receive the pattern from the generator. Multiple signature registers (116, 118) coupled to the scan chains, to receive an output of at least one of scan chains during a mode of the integrated device.
申请公布号
WO02095587(A3)
申请公布日期
2003.08.28
申请号
WO2002US15806
申请日期
2002.05.16
申请人
INTEL CORPORATION;UDAWATTA, KAPILA, B.;BABELLA, ANTHONY