发明名称 METHOD FOR DECIDING LAYER THICKNESS
摘要 PROBLEM TO BE SOLVED: To provide a method in which the optical parameter and a layer thickness of a multilayer system are decided surely than before not to react with an interference factor that affects a reflection spectrum. SOLUTION: An optimization reference is decided by the total amount of wavelength differences of all pairs of wavelength (λ<SB>1</SB>,<SB>i</SB>,λ<SB>2</SB>,<SB>j</SB>j=1,...M). COPYRIGHT: (C)2003,JPO
申请公布号 JP2003240514(A) 申请公布日期 2003.08.27
申请号 JP20030029622 申请日期 2003.02.06
申请人 LEICA MICROSYSTEMS JENA GMBH 发明人 MIKKELSEN HAKON;ENGEL HORST;WIENECKE JOACHIM
分类号 G01B11/06;(IPC1-7):G01B11/06 主分类号 G01B11/06
代理机构 代理人
主权项
地址