CIRCUIT FOR REDUCING LEAKAGE CURRENT OF PROCESSOR

摘要

PURPOSE: A circuit for reducing a leakage current of a processor is provided to reduce a current consumption by reducing a leakage current in an electronic device including a processor having a JTAG(Joint Test Action Group) test terminal. CONSTITUTION: In a circuit of an electronic device comprising a processor having a JTAG test terminal, a reset circuit, which processes a reset signal being inputted to the electronic device, is connected to a reset terminal of the processor. The reset circuit connects a resistor(R2) between an initialization test pin(P1) out of the JTAG test terminals included in the processor and a reset pin(P2) of the processor. The resistor(R2) has the same value as a pull up resistor(R1) included at the interior of the JTAG initialization test pin of the processor.