发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for fabricating a semiconductor device is provided to improve a refresh characteristic and guarantee yield-up by eliminating a pit in an active region on a substrate and by guaranteeing a stable physical structure and an excellent electrical characteristic. CONSTITUTION: An isolation region is formed on a semiconductor substrate(11) by a shallow trench isolation(STI). An insulation layer is formed on the resultant structure. An ion implantation process is performed. A rapid thermal annealing(RTA) process is performed. A key open photo/etching process is performed. The insulation layer is eliminated.</p>
申请公布号 KR20030069303(A) 申请公布日期 2003.08.27
申请号 KR20020008804 申请日期 2002.02.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, JAE JONG;HWANG, GI HYEON;KIM, GYEONG SEOK;KIM, SEONG UI;LEE, GONG SU;PARK, YEONG UK;SHIN, SEUNG MOK
分类号 H01L21/76;G03F9/00;H01L21/762;H01L23/544;(IPC1-7):H01L21/76 主分类号 H01L21/76
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