<p>PURPOSE: A method for fabricating a semiconductor device is provided to improve a refresh characteristic and guarantee yield-up by eliminating a pit in an active region on a substrate and by guaranteeing a stable physical structure and an excellent electrical characteristic. CONSTITUTION: An isolation region is formed on a semiconductor substrate(11) by a shallow trench isolation(STI). An insulation layer is formed on the resultant structure. An ion implantation process is performed. A rapid thermal annealing(RTA) process is performed. A key open photo/etching process is performed. The insulation layer is eliminated.</p>
申请公布号
KR20030069303(A)
申请公布日期
2003.08.27
申请号
KR20020008804
申请日期
2002.02.19
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
HAN, JAE JONG;HWANG, GI HYEON;KIM, GYEONG SEOK;KIM, SEONG UI;LEE, GONG SU;PARK, YEONG UK;SHIN, SEUNG MOK