发明名称 |
INSPECTION DEVICE FOR ELECTRONIC PART |
摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device for an electronic part capable of surely determining whether electric characteristics of the electronic part is good or not. SOLUTION: This inspection device for the electronic part determining whether a crysal oscillator 2 as the electronic part is good or not. The inspection device for the electronic part is provided with a holding jig 31 and a first inspection unit 24a. In the holding jig 31, a crystal oscillator 2 is placed while its bottom face 12a positioned on the lower side and the front face 10a positioned on the upper side. The first inspection unit 24a is provided with probes 62 and 63 and a pressing member 51. The probes 62 and 63 are brought into contact with an electrode 14. The pressing member 51 presses the crystal oscillator 2 to the probes 62 and 63. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003240809(A) |
申请公布日期 |
2003.08.27 |
申请号 |
JP20020039977 |
申请日期 |
2002.02.18 |
申请人 |
PIONEER ELECTRONIC CORP;PIONEER FA:KK |
发明人 |
SUNANAGA REIZO;INOUE TAKESHI;IIJIMA YOSHINORI |
分类号 |
G01R29/22;G01R31/00;(IPC1-7):G01R31/00 |
主分类号 |
G01R29/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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