| 摘要 |
PROBLEM TO BE SOLVED: To provide an interface substrate, an inspection system, and an inspecting method, for making it possible to inspect a nonstandard memory element mounted on a standard substrate for inspection in an actual operating environment. SOLUTION: The system and method for inspecting nonstandard memory elements in an actual operating environment are applicable to nonstandard memory elements by using an interface substrate 100 for adapting a nonstandard pin configuration to a standard pin configuration on a substrate 170 to be inspected. The substrate 100 has a first surface for mounting the substrate 100 on a nonstandard memory element 50, a pin matching circuit, and a second surface structured so as to connect the matching circuit to the standard pin configuration. The substrate 100 is directly mountable on the substrate 170, and connected to the substrate 170, by variously arranging a second socket 120, a socket 140, a connection substrate 130, and support materials 150. COPYRIGHT: (C)2003,JPO
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