| 摘要 |
PROBLEM TO BE SOLVED: To potentiate high-speed testing of a tested object and to make it possible to obtain an output value of the tested object. SOLUTION: This is an improvement over an IC tester for testing a tested object for outputting a multistage voltage from a plurality of pins. This device is characterized by having a voltage generating part for outputting an expected voltage value corresponding to the multistage voltage of the tested object and digital data corresponding to the expected voltage value, a comparison part for comparing an output of the tested object with an output of the generating part, and a storage part for storing therein the digital data of the generating part based on the result of comparison made by the comparison part. COPYRIGHT: (C)2003,JPO
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