| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To improve the reproducibility of measurement data in a measurement chip used for a measurement device using total reflection attenuation such as a measuring device for the resonance of a surface plasmon. <P>SOLUTION: The measurement chip 10 is formed by integrating thin film layers 12 into a dielectric block 11 formed as one block including all of one surface that an incident surface 11b, an outgoing surface 11c of a measuring optical beam, and a thin film layer 12 are formed. Then the dielectric block 11 is formed of a resin with a photoelastic coefficient less than 50×10<SP>-12</SP>Pa<SP>-1</SP>. <P>COPYRIGHT: (C)2003,JPO</p> |
