发明名称 APPARATUS FOR INSPECTING CHARACTERISTIC OF COLLIMATOR
摘要 PURPOSE: An apparatus for inspecting a characteristic of a collimator is provided to enhance device reliability by inspecting partially the collimator. CONSTITUTION: An apparatus for inspecting a characteristic of a collimator includes an inspection table(21), a grip portion(22), a light supply portion(30), a light reception portion(40), a measuring portion, and an image display portion(60). The grip portion is installed on the inspection table in order to grip the collimator. The light supply portion transfers a predetermined optical signal to the first fiber. The light reception portion is coupled to the second fiber in order to receive a return value of the optical signal of the first fiber to the second fiber. The measuring portion calculates an optical signal value of the first fiber and the return value to the second fiber. The image display portion displays a measured value of the measuring portion.
申请公布号 KR20030069435(A) 申请公布日期 2003.08.27
申请号 KR20020009072 申请日期 2002.02.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, MYEON SUN;KIM, BYEONG GON;KIM, MYEONG UN;LEE, SEOK CHAN;PARK, TAE HWAN;SUN, HONG SEOK
分类号 G01M11/00;G02B27/30;(IPC1-7):G02B27/30 主分类号 G01M11/00
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