| 摘要 |
<P>PROBLEM TO BE SOLVED: To actualize an apparatus for tester simulation allowing the same test program as one of an actual machine to run thereon and a method for tester simulation. <P>SOLUTION: This is an improvement over a tester simulation apparatus used for simulating a test for a tested object by using a tester. This apparatus is characterized by having a DUT (device under test) simulation means for simulating behaviors of the tested object, a tester simulation means for simulating behaviors of the tester based on a test program, and a delay simulation means for delaying behaviors of transferring signals, by a certain amount of delay, between the DUT simulation means and the tester simulation means. <P>COPYRIGHT: (C)2003,JPO |
