发明名称 Method of checking unevenness of light-transmitting substance, apparatus therefor, and method of sorting transparent substrates
摘要 A laser beam L from a laser 2 is introduced from an introducing surface into a transparent substrate 1 by using mirrors 31 and 32. The laser beam introduced through the transparent substrate 1 repeats a total reflection on the surfaces (main surfaces and end surfaces) of the transparent substrate 1 and enters a state in which the laser beam is almost confined in the substrate 1. When an ununiform portion such as a scratch exists on the surface of the transparent substrate 1, however, total reflecting conditions are not satisfied and the light leaks out of the ununiform portion. The leaked light is formed as an image on a CCD 6 by a lens system 7 and an image process is executed by an image processing apparatus 12. In a detected image, the ununiform portion in which the scratch or the like exists is brightly seen in a linear or a dot form in a black background, so that the ununiform portion such as a very fine scratch can be detected.
申请公布号 US6610994(B1) 申请公布日期 2003.08.26
申请号 US19990254849 申请日期 1999.05.24
申请人 HOYA CORPORATION 发明人 TANABE MASARU
分类号 G01N21/55;G01N21/896;G01N21/958;(IPC1-7):G01N21/88 主分类号 G01N21/55
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