发明名称 CHEMICAL MECHANICAL POLISHING APPARATUS AND CONTROLLING METHOD THEREOF
摘要 PURPOSE: A chemical mechanical polishing(CMP) apparatus is provided to perform a CMP process on a micro structure by using ordinary diamond slurry including silicon particles that are used as slurry generated by a CMP process performed on a semiconductor wafer. CONSTITUTION: A process setting up unit(36) provides a function of setting up a process condition and a process order for performing a CMP process on the micro structure. A control unit(35) outputs a process control signal for controlling the entire system according to the process condition and the process order set up by the process setting up unit. A carrier driving unit(37) rotates a carrier according to the process control signal. A plate driving unit(38) rotates a plate attached to a polishing pad according to the process control signal to move the polishing pad regarding the carrier. A used slurry supply unit(34) consecutively supplies the slurry including the silicon particles to the upper portion of the polishing pad according to the process control signal.
申请公布号 KR20030068791(A) 申请公布日期 2003.08.25
申请号 KR20020008407 申请日期 2002.02.18
申请人 KOREA ELECTRONICS TECHNOLOGY INSTITUTE;SONG, YOUNG HWA 发明人 CHOI, YEON SIK;JUNG, JIN SU;PARK, JUN SIK;SONG, YOUNG HWA
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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