| 摘要 |
PURPOSE: A method for sorting the temperature characteristic state of a semiconductor part and an apparatus thereof are provided to be capable of minimizing the sorting error, time, and cost for the semiconductor part and improving check precision. CONSTITUTION: An apparatus for sorting the temperature characteristic state of a semiconductor part is provided with a micro computer(1) built-in sorting part(2), a computer(3) for carrying out a serial communication with the micro computer through RS-232, and a measuring board(7) installed at the sorting part. At this time, the measuring board includes a plurality of measuring targets(4) spaced apart from each other, a plurality of sockets(5) for being connected with the measuring targets, and an LED(Light Emitting Diode)(6) installed at each socket as one-to-one correspondence.
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