| 摘要 |
<P>PROBLEM TO BE SOLVED: To shorten an inspection series for performing failure inspection of an integrated circuit which is an inspection object. <P>SOLUTION: The inspection series of the integrated circuit which is the inspection object is generated temporarily (S10), and the value allocation state to external inputs of the generated inspection series is examined and the external input having much value allocation is determined (S20), and when generating again the inspection series, the inspection series having little value allocation is generated to the external input having much value allocation (S30). <P>COPYRIGHT: (C)2003,JPO |
