发明名称 METHOD FOR PLANARIZING SiC SUBSTRATE SURFACE
摘要 PROBLEM TO BE SOLVED: To planarize the surface of a SiC single crystal substrate to an atomic level at a high speed. SOLUTION: A SiC substrate 11 is cut out from a single crystal so that surfaces (11-20) are exposed and put into a graphitic crucible 12. A polycrystalline SiC body 13 and SiC powder 14 are placed around the SiC substrate 11, and Ta plates 15 are placed under the substrate 11 and on inner walls of the crucible 12. The crucible 12 is heated in a range from 1,700°C to 2,750°C under a nitrogen atmosphere to obtain a planarized surface at an atomic level (planarity of about 0.3 nm) at a higher speed (etching rate of 200-300μm/hour) than that in a prior method. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003234313(A) 申请公布日期 2003.08.22
申请号 JP20020031066 申请日期 2002.02.07
申请人 KANSAI TLO KK 发明人 NISHIGUCHI TARO;NISHINO SHIGEHIRO
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
代理机构 代理人
主权项
地址