发明名称 INSPECTION PROBE SUBSTRATE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection probe substrate having no projections formed on a pad or no exfoliation of the pad even when the pad or a wiring pattern is fine, and its manufacturing method. SOLUTION: A roughened part 18 is formed on the pad 7 surface in contact with a conductive projection 8, to thereby improve adhesion between the pad 7 and the conductive projection 8. Since wiring 3 is formed by etching after applying roughening treatment to the whole surface of a copper foil 1, the fine wiring 3 can be formed and the adhesion between the conductive projection 8 and the pad 7 is improved. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003232810(A) 申请公布日期 2003.08.22
申请号 JP20020031137 申请日期 2002.02.07
申请人 HITACHI CABLE LTD 发明人 MATSUURA AKIRA;OKIKAWA HIROSHI;CHINDA SATOSHI
分类号 G01R31/26;G01R1/073;G01R31/28;(IPC1-7):G01R1/073 主分类号 G01R31/26
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