发明名称 Scanning probe microscope
摘要 A scanning probe microscope uses two different scanners (also called "scanning stages") that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called "x-y scanner") scans a sample in a plane (also called "x-y plane"), while the other scanner (called "z scanner") scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called "z direction") perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.
申请公布号 US2003155481(A1) 申请公布日期 2003.08.21
申请号 US20020077835 申请日期 2002.02.15
申请人 HONG JAEWAN;KWON JOONHYUNG;PARK SANG-IL 发明人 HONG JAEWAN;KWON JOONHYUNG;PARK SANG-IL
分类号 G01B21/30;G01Q10/02;G01Q10/04;G01Q20/02;G01Q30/00;G01Q60/32;G01Q60/38;G01Q70/02;G01Q70/10;H01J37/26;(IPC1-7):G02B7/04 主分类号 G01B21/30
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