发明名称 |
Integrated temperature sensor |
摘要 |
An apparatus and method are provided for sensing a physical stimulus of an integrated circuit. The apparatus and method allow for accurate die temperature measurements of the integrated circuit and are able to provide a highly accurate die temperature measurement without the need for an independent voltage source or current source.
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申请公布号 |
US2003156622(A1) |
申请公布日期 |
2003.08.21 |
申请号 |
US20020080037 |
申请日期 |
2002.02.19 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
GOLD SPENCER M.;GAUTHIER CLAUDE R.;AMICK BRIAN W.;ZARRINEH KAMRAN;BOYLE STEVEN R. |
分类号 |
G01K1/02;G01K7/00;G01K7/01;G01K7/32;G01K11/00;(IPC1-7):G01K7/00 |
主分类号 |
G01K1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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