发明名称 Method and apparatus for debugging a chip
摘要 In a first aspect, an apparatus is provided that is adapted to multiplex debug signals of an integrated circuit. The apparatus includes at least a first multiplexing circuit and a second multiplexing circuit. The first multiplexing circuit is adapted to receive first debug signals from the integrated circuit and to selectively multiplex at least a first portion of the first debug signals onto a first bus. The second multiplexing circuit is adapted to receive second debug signals from the integrated circuit and to selectively multiplex at least a first portion of the second debug signals onto a second bus. The apparatus further includes a logic circuit adapted to combine any debug signals of the first and second buses onto a third bus. An output stage of the apparatus is adapted to selectively output debug signals of the third bus. Numerous other aspects are provided, as are systems and methods.
申请公布号 US2003155944(A1) 申请公布日期 2003.08.21
申请号 US20020072103 申请日期 2002.02.08
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 VERDOORN DAVID JOEL;WOODWARD SANDRA S.
分类号 G01R31/317;(IPC1-7):H03K19/173 主分类号 G01R31/317
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