发明名称 Non-volatile semiconductor memory device and manufacturing method therefor
摘要 A non-volatile semiconductor memory device of the present invention is provided with a semiconductor substrate having a main surface, an ONO film (a laminated film of an oxide film, a nitride film and an oxide film) formed on the main surface and having a charge storage part, a pair of buried diffusion bit lines formed in the semiconductor substrate located on both sides of the ONO film, oxide films deposited on the main surface so as to cover the buried diffusion bit lines, and a transfer gate electrode formed on the ONO film.
申请公布号 US2003157758(A1) 申请公布日期 2003.08.21
申请号 US20020224319 申请日期 2002.08.21
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OHTANI JUN;OOISHI TSUKASA
分类号 H01L21/8247;H01L21/8246;H01L27/10;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/823 主分类号 H01L21/8247
代理机构 代理人
主权项
地址