发明名称 |
METHOD AND APPARATUS FOR CHARACTERIZATION OF DEVICES AND CIRCUITS |
摘要 |
A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined. |
申请公布号 |
WO03069377(A2) |
申请公布日期 |
2003.08.21 |
申请号 |
WO2003US04089 |
申请日期 |
2003.02.12 |
申请人 |
MASSACHUSETTS INSTITUTE OF TECHNOLOGY |
发明人 |
PIPE, KEVIN, P.;RAM, RAJEEV, J. |
分类号 |
G01K3/00;G01N25/18 |
主分类号 |
G01K3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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