发明名称 Process for electroplating silicon wafers
摘要 An electroplating solution comprising copper ions and a complexing agent for the copper ions and has a pH in the range of 4 to 10. The electroplating solution of the present invention makes it possible to fill trenches or via holes on silicon wafers for providing copper wiring with copper in a defect-free manner by preventing the seed layer from dissolving in the plating solution.
申请公布号 US2003155247(A1) 申请公布日期 2003.08.21
申请号 US20020078766 申请日期 2002.02.19
申请人 SHIPLEY COMPANY, L.L.C. 发明人 MIURA TAKESHI;SEITA MASARU;OTA YASUO
分类号 C25D3/38;C25D7/12;(IPC1-7):C25D3/38 主分类号 C25D3/38
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