发明名称 Semiconductor device and manufacturing method thereof
摘要 A semiconductor device for a charge pump device suitable for providing large current capacity and preventing a latch up from occurring is offered. A first and a second N-type epitaxial silicon layers are stacked on a P-type single crystalline silicon substrate, and P-type well regions are formed in the second epitaxial silicon layer. P+-type buried layers abutting on bottoms of the P-type well regions and N+-type buried layers abutting on bottoms of the P+-type buried layers and electrically isolating the P-type well regions from the single crystalline silicon substrate are formed. An MOS transistor is formed in each of the P-type well regions and a drain layer of the MOS transistor and each of the P-type well regions are electrically connected.
申请公布号 US2003155614(A1) 申请公布日期 2003.08.21
申请号 US20020329722 申请日期 2002.12.26
申请人 KANEKO SATORU;OHKODA TOSHIYUKI;MYONO TAKAO 发明人 KANEKO SATORU;OHKODA TOSHIYUKI;MYONO TAKAO
分类号 H01L27/04;H01L21/822;H01L21/8222;H01L21/8248;H01L21/8249;H01L27/06;H01L27/08;H01L27/092;H02M3/07;(IPC1-7):H01L21/823;H01L21/331 主分类号 H01L27/04
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