发明名称 |
Semiconductor device and manufacturing method thereof |
摘要 |
A semiconductor device for a charge pump device suitable for providing large current capacity and preventing a latch up from occurring is offered. A first and a second N-type epitaxial silicon layers are stacked on a P-type single crystalline silicon substrate, and P-type well regions are formed in the second epitaxial silicon layer. P+-type buried layers abutting on bottoms of the P-type well regions and N+-type buried layers abutting on bottoms of the P+-type buried layers and electrically isolating the P-type well regions from the single crystalline silicon substrate are formed. An MOS transistor is formed in each of the P-type well regions and a drain layer of the MOS transistor and each of the P-type well regions are electrically connected. |
申请公布号 |
US2003155614(A1) |
申请公布日期 |
2003.08.21 |
申请号 |
US20020329722 |
申请日期 |
2002.12.26 |
申请人 |
KANEKO SATORU;OHKODA TOSHIYUKI;MYONO TAKAO |
发明人 |
KANEKO SATORU;OHKODA TOSHIYUKI;MYONO TAKAO |
分类号 |
H01L27/04;H01L21/822;H01L21/8222;H01L21/8248;H01L21/8249;H01L27/06;H01L27/08;H01L27/092;H02M3/07;(IPC1-7):H01L21/823;H01L21/331 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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