发明名称 HIGH REPETITION RATE EXCIMER LASER SYSTEM
摘要 <p>The invention provides a3 4 kHz repetition rate fluoride excimer laser chamber (22) for producing an UV wavelength &lt; 200nm, and in particular an argon fluoride excimer laser chamber (22) for producing a UV wavelength 193 nm output. The3 4 kHz repetition rate argon fluoride excimer laser system includes an argon fluoride excimer laser chamber (22) for producing a 193 nm discharge at a pulse repetition rate3 4 kHz. The3 4 kHz repetition rate argon fluoride excimer laser chamber (10) also includes magnesium fluoride crystal optic windows (20) for outputting the 193 nm discharge as a3 4 kHz repetition rate excimer laser 193 nm output with the magnesium fluoride crystal optic windows (20) having a 255 nm induced absorption less than 0.08 Abs/42 mm when exposed to S million pulses of 193 nm light at a fluence3 40mj/cm2/pulse and a 42 mm crystal 120 nm transmission of at least 30%.</p>
申请公布号 WO2003069739(P1) 申请公布日期 2003.08.21
申请号 US2003004370 申请日期 2003.02.12
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址