发明名称 |
METHOD FOR CALCULATING LIFETIME OF BATTERY IN ELECTRONIC DEVICE AND METHOD FOR DECIDING ABNORMAL STATE OF ELECTRONIC DEVICE |
摘要 |
PURPOSE: A method for calculating a lifetime of a battery in an electronic device and a method for deciding an abnormal state of an electronic device are provided to measure the remaining lifetime of the battery and decide the abnormal state of the electronic device by using the current applied to the electronic device. CONSTITUTION: A control portion calculates the current capacity of a battery by using a standby voltage according to a consumed value of the current on standby and an operating voltage according to the consumed value of the current at operating state(135). The current capacity of the battery is compared to the existing capacity of the battery(145). An abnormal state of an electronic device is decided and indicated if a difference between the current capacity of the battery and the existing capacity of the battery exceeds a critical value(150).
|
申请公布号 |
KR20030068339(A) |
申请公布日期 |
2003.08.21 |
申请号 |
KR20020008234 |
申请日期 |
2002.02.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HAK YEOL |
分类号 |
H02J7/00;(IPC1-7):H02J7/00 |
主分类号 |
H02J7/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|