发明名称 LATERAL DMOS TRANSISTOR HAVING REDUCED SURFACE FIELD STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A lateral DMOS transistor having a reduced surface field structure and a method for manufacturing the same are provided to be capable of improving the reliability of the transistor and reducing the number of photolithography processes by forming a bottom layer between a drift region and a silicon substrate. CONSTITUTION: A lateral DMOS transistor(100) is provided with the first conductive type semiconductor substrate(102), the second conductive type drift region(104) located at the upper portion of the semiconductor substrate, the first bottom layer(106) located at the predetermined portion between the semiconductor substrate and the drift region, the second bottom layer(108) having a predetermined slope, formed and connected with one side of the first bottom layer, the first conductive type well region(118) located on the upper portion of the first bottom layer, and the first conductive type body region(116) located on the upper portion of the well region.
申请公布号 KR20030067889(A) 申请公布日期 2003.08.19
申请号 KR20020007528 申请日期 2002.02.08
申请人 FAIRCHILD KOREA SEMICONDUCTOR LTD. 发明人 JUN, CHANG GI;KIM, MIN HWAN;KIM, SEONG RYONG
分类号 H01L29/772;H01L21/266;H01L21/336;H01L21/74;H01L23/58;H01L29/08;H01L29/10;H01L29/76;H01L29/78;H01L29/94;H01L31/0328;H01L31/062;H01L31/113 主分类号 H01L29/772
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