发明名称 Semiconductor integrated circuit having anti-fuse, method of fabricating, and method of writing data in the same
摘要 A semiconductor integrated contains a first MOS transistor of a first conductivity type formed on a surface of a semiconductor substrate, and a second MOS transistor of the first conductivity type having a drain-source breakdown voltage lower than that of the first MOS transistor. The second MOS transistor is used as an anti-fuse, which can be changed to a conductive state with a low writing voltage that does not damage the first MOS transistor. The second MOS transistor is fabricated such that a concentration of a second conductivity type impurity in at least a portion of the channel region adjacent to the drain region is higher than that in a corresponding portion of the first MOS transistor.
申请公布号 US6608355(B2) 申请公布日期 2003.08.19
申请号 US20020076652 申请日期 2002.02.19
申请人 KAWASAKI MICROELECTRONICS, LTD. 发明人 ARIYOSHI RYUJI;KUNO ISAMU;FUKUSHIMA TAKAHITO;AOIKE JUNJI
分类号 H01L21/8234;H01L23/525;H01L27/088;(IPC1-7):H01L29/76 主分类号 H01L21/8234
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