发明名称 DEVICE AND METHOD FOR MEASURING SURFACE
摘要 <p>PURPOSE: A surface measuring device and a method thereof are provided to measure parallel on both sides of a sample and the surface simultaneously and simply, and to arrange the optical system easily by irradiating parallel light on both surfaces of the sample and interfering with reflected light. CONSTITUTION: A surface measuring device comprises a light source(11) generating the same wavelength light; an optical unit converting light into a parallel ray; an irradiation and interference unit dividing parallel rays into two paths and irradiating to both sides of a sample(16), and interfering by focusing reflected rays opposite to the parallel rays through two paths; and a display unit(17) displaying interference rays from reflected rays for observation. The parallel on both sides of the sample and relative surfaces are measured conveniently at the same time.</p>
申请公布号 KR20030067993(A) 申请公布日期 2003.08.19
申请号 KR20020007769 申请日期 2002.02.09
申请人 AGENCY FOR DEFENSE DEVELOPMENT 发明人 KIM, HYEON SUK;KIM, YEON SU
分类号 G01B9/02;G01B11/25;G01B11/30;(IPC1-7):G01B11/30 主分类号 G01B9/02
代理机构 代理人
主权项
地址