发明名称 |
DEVICE AND METHOD FOR MEASURING SURFACE |
摘要 |
<p>PURPOSE: A surface measuring device and a method thereof are provided to measure parallel on both sides of a sample and the surface simultaneously and simply, and to arrange the optical system easily by irradiating parallel light on both surfaces of the sample and interfering with reflected light. CONSTITUTION: A surface measuring device comprises a light source(11) generating the same wavelength light; an optical unit converting light into a parallel ray; an irradiation and interference unit dividing parallel rays into two paths and irradiating to both sides of a sample(16), and interfering by focusing reflected rays opposite to the parallel rays through two paths; and a display unit(17) displaying interference rays from reflected rays for observation. The parallel on both sides of the sample and relative surfaces are measured conveniently at the same time.</p> |
申请公布号 |
KR20030067993(A) |
申请公布日期 |
2003.08.19 |
申请号 |
KR20020007769 |
申请日期 |
2002.02.09 |
申请人 |
AGENCY FOR DEFENSE DEVELOPMENT |
发明人 |
KIM, HYEON SUK;KIM, YEON SU |
分类号 |
G01B9/02;G01B11/25;G01B11/30;(IPC1-7):G01B11/30 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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