发明名称 METHOD FOR MANUFACTURING SOLID-STATE IMAGING APPARATUS
摘要 PROBLEM TO BE SOLVED: To facilitate exfoliation and elimination of resist for a pad window aperture without causing ununiformity which becomes cause of image pickup irregularity on a surface of an on-chip microlens, and maintain mechanical strength of wire bonding by preventing reduction of film thickness of an aluminum electrode of a pad part. SOLUTION: After the on-chip microlens 22 is formed, a part of the on-chip microlens 22 which part corresponds to the pad part 14 is eliminated, a pad window 28 is formed, and a surface of the on-chip microlens is made uniform. By using plasma dry etching treatment which uses only oxygen gas, production of a cured film of the resist 24 for the pad window aperture is reduced. Further, reduction of film thickness of the aluminum electrode of the pad part 14 is prevented. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003229551(A) 申请公布日期 2003.08.15
申请号 JP20020025951 申请日期 2002.02.01
申请人 SONY CORP 发明人 NATORI TAICHI;KAMIIE HITOMI;TOUMIYA YOSHITETSU
分类号 H01L27/14;H01L21/302;H01L21/306;H01L21/3065;H01L21/461;H01L31/10;H04N5/335;(IPC1-7):H01L27/14 主分类号 H01L27/14
代理机构 代理人
主权项
地址