METHOD AND APPARATUS FOR MEMORY SELF TESTING

摘要

PROBLEM TO BE SOLVED: To provide a self-test controller which is useful for self-testing faults of various memories in which a manufacturer and a design system are different, and which is programmable.

SOLUTION: A self-test controller 10 is responsive to scanned in self-test instructions to carry out test operations including generating a sequence of memory addresses that are specified by the self-test instruction. Combining multiple such self-test instructions allows a custom test methodology to be built up by a user using a generic self-test controller 10.

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