发明名称 SENSOR FOR UTILIZING TOTAL REFLECTION ATTENUATION
摘要 PROBLEM TO BE SOLVED: To accurately measure the state of total reflection attenuation regardless of the refractive index of a sample in a sensor utilizing total reflection attenuation. SOLUTION: In the sensor, light beams 13 are applied so that various incident angles can be obtained to an interface 10b between a dielectric block 10 and a metal film 12, the light beams 13 that are totally reflected from the interface 10b are detected by a photodiode array 17, and the characteristics of a sample liquid 11 are analyzed. In the sensor, the following dark line position adjustment operation is made before measurement. First, an incident angle control section 34 detects the profile of the light beams 13, thus obtaining the relative position of a dark line D for indicating the state of total reflection attenuation in the profile. A light source 14 and a condensing lens 15 are moved so that the dark line D is at the center of the profile, and an incident angle where the beams 13 enter the interface 10b is adjusted. Measurement can be made in a state where the dark line D is at the center of the profile regardless of the refractive index of the sample liquid 11. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003227792(A) 申请公布日期 2003.08.15
申请号 JP20020025602 申请日期 2002.02.01
申请人 FUJI PHOTO FILM CO LTD 发明人 SHIMIZU HITOSHI
分类号 G01N21/03;G01N21/27;(IPC1-7):G01N21/27 主分类号 G01N21/03
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