发明名称 CIRCUIT PATTERN DETECTOR AND CIRCUIT PATTERN INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a circuit pattern detector and circuit pattern inspection method for accurately detecting voltage distribution of a circuit pattern formed on a circuit board optically and inspecting the short or disconnection of the circuit pattern. SOLUTION: A transparent conductive layer 12 is formed on a glass substrate 11. On the surface of an electrooptical crystal layer 15, a reflection prevention layer 14 and a reflection layer 16 are formed. On the surface (lower surface) of the transparent conductive layer 12, the reflection prevention layer 14 of the electrooptical crystal layer is bonded putting an adhesive layer 13 in between. That is, between the adhesive layer 13 and the electrooptical crystal layer 15, the reflection prevention layer 14 is provided. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003227859(A) 申请公布日期 2003.08.15
申请号 JP20020206035 申请日期 2002.07.15
申请人 TOPPAN PRINTING CO LTD 发明人 YANAGISAWA YASUYUKI
分类号 G01R31/02;G01N21/956;G01R31/302;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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