| 发明名称 |
Method for burn-in testing |
| 摘要 |
Method for burn-in testing of a wafer having a plurality of dies where the reliability of the fail rate is matched to meet a predetermined criteria. This is accomplished by selecting a subset of dies to be tested and tests are used to weed out the highest number of failures.
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| 申请公布号 |
US2003151422(A1) |
申请公布日期 |
2003.08.14 |
| 申请号 |
US20020248126 |
申请日期 |
2002.12.19 |
| 申请人 |
BARNETT THOMAS S.;GRADY MATTHEW S.;PURDY KATHLEEN G. |
发明人 |
BARNETT THOMAS S.;GRADY MATTHEW S.;PURDY KATHLEEN G. |
| 分类号 |
G06F17/18;(IPC1-7):G01R31/26 |
主分类号 |
G06F17/18 |
| 代理机构 |
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