发明名称 |
MEMORY CELL |
摘要 |
Disclosed is a memory cell comprising a sequence of layers in the trench, said sequence of layers consisting of a first oxide layer (1), a nitride layer (2), and a second oxide layer (3) facing the gate electrode on the side walls of the trench. The nitride layer (2) is missing in a bent area (4) on the bottom of the trench. In an alternative embodiment of the invention, a step is configured on the side walls of the trench, preferably below the source area or the drain area. |
申请公布号 |
WO03067668(A2) |
申请公布日期 |
2003.08.14 |
申请号 |
WO2003DE00135 |
申请日期 |
2003.01.17 |
申请人 |
INFINEON TECHNOLOGIES AG;DEPPE, JOACHIM;KLEINT, CHRISTOPH;LUDWIG, CHRISTOPH |
发明人 |
DEPPE, JOACHIM;KLEINT, CHRISTOPH;LUDWIG, CHRISTOPH |
分类号 |
H01L21/8247;H01L21/28;H01L27/115;H01L29/423;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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