发明名称 Semiconductor device and method of manufacturing the same
摘要 To a provide a method of forming a layered film of a silicon nitride film and a silicon oxide film on a glass substrate in a short time without requiring a plurality of film deposition chambers. In a thin film transistor, a layered film including a silicon nitride oxide film (12) is formed between a semiconductor layer (13) and a substrate (11) using the same chamber. The silicon nitride oxide film has a continuously changing composition ration of nitrogen or oxygen. An electric characteristic of the TFT is thus improved.
申请公布号 US2003151119(A1) 申请公布日期 2003.08.14
申请号 US20030367819 申请日期 2003.02.19
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 SAKAMA MITSUNORI;ISHIMARU NORIKO;MIWA MASAHIKO;IWAI MITINORI
分类号 H01L29/786;G02F1/136;G02F1/1362;G02F1/1368;H01L21/77;H01L21/84;H01L27/12;(IPC1-7):H01L23/58 主分类号 H01L29/786
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