| 摘要 |
A detection system for identifying surface irregularities such as cracks, pits, scratches and holes in a part that is made of a material having a relatively high reflectivity and a relatively low emissivity such as titanium, aluminum, and silicon (such as silicon solar panels). A laser source generates a laser beam having a diameter that is approximately 50 microns or less. A scanning device scans the laser beam across the surface of the part. A surface irregularity radiates energy from said laser beam. An infrared receiver is directed at the surface of the part. The infrared receiver generates an infrared signal of the surface. A display that is connected to the infrared receiver displays the infrared signal to identify surface irregularities. Preferably, the infrared receiver is oriented at a first angle relative to a line perpendicular to the surface of the part. The first angle is preferably greater than 20 degrees and less than 30 degrees. An image processing module performs image processing on the infrared signal. A peak detection image processor compares the infrared signal generated by the infrared receiver to a threshold signal and declares a surface irregularity when the infrared signal exceeds the threshold signal.
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