发明名称 Three-dimensional model analyzing apparatus
摘要 A three-dimensional model analyzing apparatus for optimally segmenting a three-dimensional model to be analyzed. Input unit inputs a three-dimensional model to be analyzed, and rotated model generating unit causes the three-dimensional model input from the input unit to rotate successively by a predetermined angle in a three-dimensional space, to generate a plurality of rotated models derived at different angles. Segmenting unit segments each of the rotated models into a plurality of polyhedrons having an identical shape, and comparing unit compares the surface area or volume of each rotated model segmented by the segmenting unit with the surface area or volume of the original three-dimensional model. Presenting unit presents an optimum rotated model in accordance with the results of comparison by the comparing unit.
申请公布号 US6606090(B2) 申请公布日期 2003.08.12
申请号 US20010790636 申请日期 2001.02.23
申请人 FUJITSU NAGANO SYSTEMS ENGINEERING LIMITED 发明人 SHIMAMURA KOUICHI
分类号 G06F17/50;G06T17/10;(IPC1-7):G06T15/00 主分类号 G06F17/50
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