发明名称 High voltage discharge circuit
摘要 This invention provides a circuit and a method for discharging a high voltage to ground level from a circuit node especially in intergrated circuits. The invention relates to a high voltage discharge circuit which prevents semiconductor latch-up and prevents semiconductor damage during the discharge process. In addition, the discharge process takes a short amount of time. A feedback mechanism from the drains of the FETs through inverters back to gate #2 of the dual-gated FETs causes the individual drains of series connected FETs to discharge rapidly. The discharge mechanism of this invention minimizes the voltage times current power and therefore protects the integrated devices from damage.
申请公布号 US6605973(B1) 申请公布日期 2003.08.12
申请号 US20020099214 申请日期 2002.03.15
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 CHIH YUE-DER
分类号 H03K17/10;(IPC1-7):H03K5/08 主分类号 H03K17/10
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