发明名称 Scan structure for CMOS storage elements
摘要 Scan chain links which step data through a scan chain using only a single control signal, and which require a reduced number of transistors to scan data into and out of a latch. One scan chain link, which allows the output of a scanned latch to "wiggle", uses eight transistors and only a single control signal. Another scan chain link, which prevents the output of a scanned latch from "wiggling", and which allows data to be maintained in a latch during a scan operation if it is so desired, uses twenty-five transistors and two control signals: one control signal for stepping data through a scan chain, and an additional control signal for preventing the output of a scanned latch from wiggling.
申请公布号 US6606720(B1) 申请公布日期 2003.08.12
申请号 US20000510006 申请日期 2000.02.22
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY 发明人 NAFFZIGER SAMUEL D.
分类号 G01R31/28;G01R31/3185;G06F11/22;G11C19/00;G11C19/28;H03K3/037;(IPC1-7):G01R31/28 主分类号 G01R31/28
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