发明名称 Field-effect semiconductor device
摘要 A field-effect semiconductor device includes a channel layer; a barrier structure formed on the channel layer and including a plurality of semiconductor layers; a plurality of ohmic electrodes formed above the barrier structure; and a Schottky electrode formed on the barrier structure between the ohmic electrodes. The barrier structure has an electron-affinity less than that of the channel layer and includes at least two heavily doped layers and a lightly doped layer provided therebetween.
申请公布号 US6605831(B1) 申请公布日期 2003.08.12
申请号 US20000659134 申请日期 2000.09.11
申请人 MURATA MANUFACTURING CO., LTD. 发明人 INAI MAKOTO;SASAKI HIDEHIKO
分类号 H01L29/812;H01L21/338;H01L29/778;H01L29/80;(IPC1-7):H01L31/032;H01L31/033 主分类号 H01L29/812
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