发明名称 CARBON-GRADED LAYER FOR IMPROVED ADHESION OF LOW-K DIELECTRICS TO SILICON SUBSTRATES
摘要 A structure and method for an insulator layer having carbon-graded layers above a substrate is disclosed, wherein the concentration of carbon increases in each successive carbon-graded layer above the substrate. The insulator comprises a low-k dielectric having a dielectric constant less than 3.3. The carbon-graded layer increases adhesion between the substrate and the insulator and between the insulator and the conductor layer. The structure may also include stabilization interfaces between the carbon-graded layers. More specifically, the carbon-graded layers include a first layer adjacent the substrate having a carbon content between about 5% and 20%, a second layer above the first layer having a carbon content between about 10% and 30%, and a third layer above the second layer having a carbon content between about 20% and 40%.
申请公布号 WO03009380(A3) 申请公布日期 2003.08.07
申请号 WO2002GB01370 申请日期 2002.03.21
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM UNITED KINGDOM LIMITED 发明人 CONTI, RICHARD;DEV, PRAKASH;DOBUZINSKY, DAVID, MARK;EDELSTEIN, DANIEL, CHARLES;LEE, GILL;LOW, KIA-SENG;SHAFER, PADRAIC;SIMPSON, ALEXANDER;WRSCHKA, PETER
分类号 H01L21/28;H01L21/316;H01L23/532;H01L29/51 主分类号 H01L21/28
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